Abstract
AbstractThe demand for high‐energy radiation detection systems combining high sensitivity, low‐cost and large‐area fabrication has pushed the research on hybrid perovskites as promising materials for X‐ and γ‐photon detection, thanks to their high Z atoms, solution‐processability, and high optoelectronic performance. Here, flexible direct X‐ray detectors are demonstrated with outstanding real‐time detection properties. They are based on printed micrometers‐thick films of methylammonium lead triiodide nanocrystals inks, formulated in low boiling point and benign solvents. Record optoelectronic performances, such as high X‐ray sensitivity (up to 2270 µC Gy−1 cm−2), radiation tolerance over 2.2 Gy of total dose, and fast response time (48 ms) have been achieved by using a simple device architecture and materials processing The functionality under strong bending stress (strain > 10%) and under high X‐ray energy (up to 150 keV) has been assessed, opening the way for flexible real‐time direct radiation detectors and imagers, operating at low‐voltages (bias < 4V) and apt to be fabricated by means of large‐area scalable processes.
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