Abstract
AbstractThis issue of MRS Bulletin focuses on the rapid progress that is ongoing in the development of hard x-ray microscopies with three-dimensional spatial resolutions ranging from micrometers to nanometers. The individual articles provide a crosscut of developments in hard x-ray projection tomography microscopy for imaging density and chemical fluctuations in crystalline and noncrystalline materials; large-angle diffractionbased, spatially resolved imaging of local structure, orientation, and strain distributions in crystalline materials; and emerging coherent diffraction imaging for nanometer-range Fourier transform imaging of crystalline and noncrystalline materials.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
