Abstract
Journal Article High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films Get access Leixin Miao, Leixin Miao Pennsylvania State University, University Park, Pennsylvania, United States Search for other works by this author on: Oxford Academic Google Scholar George Kotsonis, George Kotsonis Pennsylvania State University, University Park, Pennsylvania, United States Search for other works by this author on: Oxford Academic Google Scholar Jon-Paul Maria, Jon-Paul Maria Pennsylvania State University, University Park, Pennsylvania, United States Search for other works by this author on: Oxford Academic Google Scholar Nasim Alem Nasim Alem Pennsylvania State University, University Park, Pennsylvania, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 1196–1197, https://doi.org/10.1017/S1431927620017304 Published: 01 August 2020
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