Abstract
We present new results from the soft X-ray scanning photoemission microscope: MAXIMUM. The microscope is installed at the U41 undulator at the Synchrotron Radiation Center at the University of Wisconsin. The instrument is based on a multilayer-coated Schwarzchild objective, operating at 95 eV, and it has demonstrated spatial resolution better than 0.1 μm and electron energy resolution of 300 meV. We review the design and the implementation of the microscope. We also present recent results as well as a summary of the research programs that are being conducted with MAXIMUM.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
