Abstract
A crystal spectrometer combined with a position-sensitive proportional counter was developed for analysing particle-induced X-rays. Three satellite lines (KL 0, KL 1, and KL 2) of Si K α X-rays produced by 1.5 MeV H + ion bombardment were well resolved. Energy resolutions of 3 and 30 eV are obtained, respectively, for Si K X-rays (1.74 keV) and Cr K α1 X-rays (5.414 keV). This method is expected to give a high-resolution PIXE of reasonable efficiency with low background or high detection limit, especially, for analysing light-element impurities in heavy-element matrix, and also to be useful for studies of ion-atom collisions, such as bremsstrahlung production and chemical effects in ion-atom collisions.
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