High resolution molecular gas phase photoelectron spectra of core levels using synchrotron radiation - vibrational and ligand field splittings

Abstract

A new high resolution photoelectron spectrometer designed for core level photoelectron studies of gas phase volatile and involatile compounds using synchrotron radiation is briefly described. Xenon NOO Auger spectral linewidths of 0.13 eV indicate that the electron resolution is < 0.05 eV. The Xe 4d photoelectron linewidth of ≈0.20 eV, for an inherent linewidth of ⩾ 0.13 eV, shows that the photon width is close to the theoretical 0.12 Å (0.09 eV at 94 eV). This resolution is sufficient to observe, for the first time, vibrational splitting of the Si 2p core level of SiH 4 and ligand field splitting of the Xe 4d core level of XeF 2.