Abstract
A knife-edge method for profiling focused and unfocused laser beams with a high spatial resolution is presented. High resolution is achieved by dithering the knife-edge in the scan direction. The method is equivalent to the slit method but with a variable slit width also on a sub-μm scale. A signal-to-noise ratio of 10 6 : 1 has been demonstrated. The design is nearly as simple and of low-cost as that of the conventional knife-edge method. The inversion algorithm used for obtaining the beam profiles from knife-edge data is discussed. An excellent agreement is found between measured and calculated beam profiles. The accuracy of this method is demonstrated also with beam propagation measurements.
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