Abstract
A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method. PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries. Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture.
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