Abstract
This article reviews the application of high resolution electron microscopy techniques to zeolite structural characterization. Examples given in this article include identification of structural intergrowth, stacking faults and framework projection net from high resolution images. Slow-scan CCD (charge-coupled device) cameras, representing the latest advance in electron microscopy instrumentation, are briefly introduced. Low-dose, high resolution electron microscopy using commercial CCD cameras is discussed. With slow-scan CCD cameras, it is shown that it is possible to directly read off the underlying zeolite structures from experimental high resolution images when suitable image processing techniques are employed. This latest advance greatly enhances the power of high resolution electron microscopy techniques in solving unknown zeolite structures.
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