Abstract
SUMMARYThe image contrast of extremely thin films of amorphous carbonaceous materials has been studied experimentally using thin supporting films of single crystal graphite. The use of thin specimens reduces the ‘overlap’ effect in imaging amorphous materials. Image contrast of their images was therefore interpreted by the ‘projected potential approximation’.Single sheets of graphitic carbon crystal were imaged with c perpendicular to the beam and their image details were compared with those of the amorphous carbon films. This comparison demonstrated that amorphous carbon films prepared by evaporation contained microcrystalline regions having graphitic structure.
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