Abstract
In the study of interfaces, HREM is most useful when the interface is viewed edge-on while both crystals are accurately aligned along low index zone axes. The formation of such interfaces by epitaxy or topotaxy is the natural means of obtaining structures than can be usefully analyzed by HREM. Furthermore, there is intense interest in understanding the atomic structure of such interfaces in a variety of technologically important materials. This contribution addresses such structures produced by thermal decomposition, precipitation reactions and ionized-cluster-beam deposition, and reports on the structural investigation of symmetrical and asymmetrical grain boundaries, precipitate/matrix interfaces, internal defect structure of precipitates and nanocrystalline composites. 21 refs., 9 figs.
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