Abstract
We have investigated the possibilities of imaging atomic positions having distances below 2Å in the example of a silicate, the monoclinic Gd2SiO5 which has a high degree of stability in the electron beam, intermediate cell parameters (a = 9.12, b = 7.06, c = 6.73 Å, β = 107°35', space group P21/c) and two species of atoms (Gd,Si) as main contributors to the contrast. The atomic parameters of the structure used for contrast calculations were given by Smolin and Tkachev (1969).Through-focus series for the projections along [100] and [001] were made for several specimens using a JEM 100 C electron microscope equipped with a high resolution objective pole piece (Yanaka et al., 1974). Powder flakes with platy surfaces show cleavage steps (terraces) along margins, each of which has a rather constant thickness. The contrast pattern varies within a single terrace, most likely as a result of minute differences in orientation due to bending of the crystal flake.
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