High resolution electron microscopic study of tin dioxide crystals

Abstract

Crystals of Sb-doped tin dioxide have been examined by high resolution electron microscopy (≤2.3 Å point-to-point resolution) in [100], [001], and [1 111] zone axes projections, and images of twin interfaces, inclined defects, and a possible crystallographic shear plane have been recorded. Image simulations confirmed that the metal atom rows have been clearly resolved in each of these three low-index projections for specific electron-optical conditions. Image observation and consideration of the possible atomic arrangements about a (011)-type twin interface suggested that this resulted from a glide operation given by 1 2 〈1 11〉 (011) and a very close match with an experimental through-focal series was obtained using computer image simulations. The structural determination of crystal defects by high resolution electron microscopy is briefly discussed.