Abstract
SUMMARYMicrostructures of superconducting Nb3X(A15) compounds are studied by means of high resolution electron microscopy. Structure images are obtained with the 400kV high resolution electron microscope for both the annealed and ion‐irradiated crystals. The images obtained from the annealed crystals show bright contrast patterns similar to the projections of Nb and X atoms comprising the A15 structure. Defects observed in the annealed crystal irradiated with 40 kV Nb+ ions show characteristic features in contrast. The dependence of image contrast on the element X and the atomic structures of the defects are discussed by comparison with the calculated images.
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