Abstract
It is rare that useful information can be obtained by high resolution microscopy alone. If the weak phase approximation is valid, the resolution is invariably too low; and if it is not, then ambiguities in interpretation necessitate comparison simulations for which, very often, added information is required. Examples are given from the crystalline structure analysis of both uniform and locally variable material for which either the images obtained in thin regions necessarily do not contain sufficient information or for which thicker film lattice images are necessarily uninterpretable. The relevance of “indirect” approaches, such as the use of moire and dark field methods, will be emphasized both as an aid to the interpretation of axial high resolution images and as giving, on occasion, more useful information than can be obtained by the “direct” approach.
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