High resolution curvature sensor based on enhanced backscattering in side polished optic fiber

Abstract

A high-resolution curvature sensor based on enhanced backscattering in side polished optic fiber is proposed and experimentally investigated. Directional curvature sensor fabrication procession and operating principle are introduced. A push–pull structure with 2 side polished curvature sensors sticking on opposite sides of an elastic beam is used to enhance sensitivity and responsive linearity. Experiments are carried out by high accuracy relative intensity (RI) measurement system based on modified pulse self-referencing technology. Experimental results show that curvature sensor can achieve a sensitivity of 15.21 dB/m−1 in the curvature range of −0.48–0.48 m−1, and the curvature resolution is as low as 2 × 10−5m−1.