High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

Joon Sik Park,Choong-Heui Chung,Young Min Park,Sangyeob Lee

doi:10.1016/j.dib.2020.105177

Joon Sik Park, Choong-Heui Chung + Show 2 more

Open Access

https://doi.org/10.1016/j.dib.2020.105177

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Abstract

This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD) images of InAs(001) surface were obtained. The InAs(001) surface reconstruction images observed by STM and AFM are compared. The effect of AFM tip condition and tip-sample distance to AFM and KPFM imaging is verified by measuring frequency shift vs. tip-sample distance spectroscopy. This data article is related to the article entitled, “Kelvin prove force microscopy and its application” (Melitz et al., 2011) [1].

Highlights

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
The InAs(001) surface reconstruction images observed by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) are compared
The effect of AFM tip condition and tip-sample distance to AFM and Kelvin probe force microscopy (KPFM) imaging is verified by measuring frequency shift vs. tipsample distance spectroscopy

Summary

Introduction

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method. This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.

Results

Conclusion