High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices

Abstract

We set up a compact high-resolution linear charge-coupled-device (CCD)-based spectrometer for the characterization of optoelectronic materials and devices. The spectrometer is controlled by a personal computer. Detailed design diagrams of the mechanical structure and electronic hardware are described. Spectral resolution of the CCD measurement system of ~0.7 A/pixel is determined from spectral calibration using two laser sources. Electroluminescent measurements of several selective optoelectronic components, as well as the transmission measurements of GaSe and GaSe 0.9 S 0.1 layered semiconductors, are performed utilizing the new spectrometer. The experimental results are analyzed and discussed.