Abstract
The facet heating of high-power laser diodes significantly influences device reliability. To mitigate facet temperature, current blocking (CB) regions are employed at both cavity facets of the laser. In this paper, we investigate the device characteristics of uncooled InGaAlAs lasers with CB facets. We observe two types of light versus current (LI) curves and propose corresponding physical models. Our findings demonstrate the high reliability performance of uncooled lasers with proper engineering design and CB process.
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