Abstract
Hot wire cell method has been newly developed and successfully applied to grow polycrystalline and amorphous Si thin films with relatively high growth rates of 0.4-2.0 nm/s. It is found that polycrystalline Si films can be obtained at substrate temperatures of 175-400/spl deg/C without a hydrogen dilution when the filament temperature is 2000-2100/spl deg/C. Valency control has been carried out by using of PH/sub 3/ and B/sub 2/H/sub 6/. Up to now, high conductivities of 13 S/cm and 4 S/cm have been achieved for n-type and p-type polycrystalline Si thin films, respectively. Polycrystalline Si and a-Si solar cells prepared with the deposition rates of 0.4-1.0 nm/s showed the efficiencies of /spl sim/1% and 4.3%, respectively. We found by SIMS analysis that the high concentration of O and C atoms is incorporated into the film which limits the present cell performances.
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