High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms

Chun-Hung Chen Chun-Hung Chen,J.A Abraham

doi:10.1109/test.1991.519725

High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms

Chun-Hung Chen Chun-Hung Chen, J.A Abraham

https://doi.org/10.1109/test.1991.519725

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Publication Date: Oct 26, 1991

Citations: 16

Affiliation: The University of Texas at Austin

#Switch-level Circuits #Stuck-open Faults + Show 8 more

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Abstract

This paper presents an approach to developing high quality tests for switch-level circuits using both current. and logic test generation algorithms. Clear definitions for analyzing the effectiveness of the joint !,est generation approach are derived. Results on a set of switch-level circuits show very high coverage of stuickat, st,uck-on, and stuck-open faults when both current and logic tests are used.

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