Abstract

Hydrogenated amorphous silicon films were deposited by the direct photolysis of disilane using windowless hydrogen discharge. Electrical and optical properties of the films have been investigated. The photosensitivity (σph/σd) is about 107 in the films prepared at 250 °C, better than that of films obtained by conventional rf plasma chemical vapor deposition.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.