High quality, high index-contrast chalcogenide microdisk resonators.

Abstract

We demonstrate the high quality (Q) factor microdisk resonators in high index-contrast chalcogenide glass (ChG) film GeSbSe using electron-beam lithography followed by plasma dry etching. High confinement, low-loss, and single-point-coupled microdisk resonators with a loaded Q factor of 5×105 are measured. We also present pulley-coupled microdisk resonators for relaxing the requirements on the coupling gap. While adjusting the wrap-around coupling waveguides to be phase-matched to the resonator mode, a single specific microdisk radial mode can be excited. Moreover, the thermal characterization of microdisk resonators is carried out to estimate the thermo-optic coefficient of 6.7×10-5/K for bulk ChG.