Abstract
PurposeThis paper aims to present an efficient method to improve quality factor of printed fractal inductors based on electromagnetic band-gap (EBG) surface.Design/methodology/approachHilbert fractal inductor is designed and simulated using high-frequency structural simulator. To improve the quality factor, an EBG surface underneath the inductor is incorporated without any degradation in inductance value.FindingsThe proposed inductor and Q factor are measured based on well-known three-dimensional simulator, and the results are compared experimentally.Practical implicationsThe proposed method was able to significantly decrease the noise with increase in the speed of radio frequency and sensor-integrated circuit design.Originality/valueFractal inductor is designed and simulated with and without EBG surfaces. The measurement of printed circuit board prototypes demonstrates that the inclusion of split-ring array as EBG surface increases the quality factor by 90 per cent over standard fractal inductor of the same dimensions with a small degradation in inductance value and is capable of operating up to 2.4 GHz frequency range.
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