Abstract

High-purity cubic GaN films have been successfully grown on a AlGaAs buffer layer by molecular beam epitaxy. A characteristic nitrided AlGaAs smooth faceted surface was observed. It was found that GaN epilayers grown on a nitrided Al 0.17Ga 0.83As buffer layer were epitaxial and contained only the cubic phase. No diffraction peaks associated with the hexagonal phase of GaN were observed by X-ray pole-figure measurements.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.