Abstract
Inelastic X-ray scattering (IXS) is a general experimental technique for studying lattice and electronic excitations, which has undergone rapid development following the advent of the third generation synchrotron radiation facilities. X-ray Raman scattering (XRS) is inelastic scattering of X-rays due to the excitation associated with bound electrons in an atom. Its very small scattering cross-section is compensated for by a high-flux beam generated from a strong photon source. Instrumentation for IXS is now highly sophisticated, and has been applied to study a broad range of condensed matter systems [1].
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