Abstract
This work presents the study of the synthesis and characterization of polycrystalline diamond (PCD) compacts using a bi-layered assembly method and solving the catastrophic nature of failure molding when using single-layered assembly and 0.5–1.5 μm diamond powder as starting materials. The well-sintered PCD compacts are prepared on WC-16wt% Co substrates at temperatures from 1350 °C to 1500 °C for 15 min at static high pressure of 5.2 GPa, using the bi-layered assembly method. According to our scanning electron microscope observation, the specimens sintered at 1450 °C have a homogeneous microstructure. The graphitization of the diamond appears at 1500 °C according to X-ray diffraction analysis. The specimens sintered at 1450 °C show the best performance according to the wear resistance test.
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