Abstract
Traditional methods of coherent diffraction imaging using random masks result in an insufficient difference between the diffraction patterns, making it challenging to form a strong amplitude constraint, causing significant speckle noise in the measurement results. Hence, this study proposes an optimized mask design method combining random and Fresnel masks. Increasing the difference between diffraction intensity patterns enhances the amplitude constraint, suppresses the speckle noise effectively, and improves the phase recovery accuracy. The numerical distribution of the modulation masks is optimized by adjusting the combination ratio of the two mask modes. The simulation and physical experiments show that the reconstruction results of PSNR and SSIM using the proposed method are higher than those using random masks, and the speckle noises are effectively reduced.
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