High Precision Mass Spectroscopy Using Highly Charged Ions in a Penning Trap

Abstract

High precision mass measurements are performed at the SMILETRAP facility by measuring the cyclotron frequencies of ions trapped in the electric and magnetic fields of a Penning trap. Since the resolving power increases linearly with the ion charge state, the SMILETRAP experiment is connected to an Electron Beam Ion Source (EBIS). Using this technique we have shown that we are able to measure routinely the mass of any stable element within 1 ppb accuracy. Examples of some of the recent mass measurements and their possible applications for various fields of atomic and nuclear physics are given.