Abstract
Benefiting from high specific stiffness and high reflectance, aluminum optics with a complex surface profile are widely used in aerospace optical systems which have strict requirements for volume of the systems. Contact figuring polishing process provides highly deterministic technology for the fabrication of high precision aluminum optics. However, due to the high chemical activity of aluminum, the inevitable contamination layer will generate on the surface and bring difficulties for the subsequent processes, which greatly limit the fabrication precision. Ion beam figuring (IBF) is an effectively technology that can remove the contamination layer and improve surface quality. But, the surface profile may deteriorate during IBF. In this study, through experimental method, the nonuniformity of the contamination layer is found to be the inducer for deterioration and deviation of surface profile during IBF. The mapping between the characteristics of contamination layer and dwell time of contact polishing is studied. The thickness of the contamination layer will firstly increase with dwell time and stabilize to 120 nm when the dwell time exceeds a specific value. The variation of the IBF removal function with removal depth is also revealed through experimental and theoretical methods. Due to the dynamic variation of the composition in the contamination layer during IBF, the removal function increases with the removal depth and stabilizes when the depth exceeds 60 nm (the contamination layer is fully removed). Consequently, we propose two processing strategies to improve the aluminum optics fabrication process. Comparative experiments are performed on two off-axis aspherical surfaces. The results indicate that the surface profile can be stably maintained and improved during IBF processing based on the proposed strategies. Our research will significantly improve the fabrication precision of aluminum optics and promote the application of aluminum optics to the visible and even ultraviolet band.
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