Abstract
Copper ferrite thin films, radio-frequency sputtered at 200 W, on fused quartz substrates, postannealed at about 800 °C and slow cooled, exhibited a tetragonal copper ferrite phase, but with a preferred orientation of mainly a (311) or (400) peak. The films show a perpendicular coercivity of about 3000 Oe or more, almost two times the parallel coercivity. Magnetocrystalline anisotropy is the major cause of the high coercivity observed in these films. The perpendicular anisotropy of these films is attributed to the texture with the hard axis in the film plane as seen by texture measurement.
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