Abstract
Surface-enhanced Raman scattering (SERS), an advanced technique for molecular spectroscopy, relies heavily on the preparation of SERS active materials that can significantly enhance the Raman scattering signals for highly sensitive detection of trace molecules. Traditionally, SERS measurements are performed on silicon or silica substrates, the SERS performance is determined by the structure of SERS materials. Here, we show that the SERS signal can be amplified and modulated using Fabry-Pérot (F-P) cavities made of silica-silicon (SiO2-Si) or silica-gold-silicon (SiO2-Au-Si) multilayers as substrates. Periodic SERS signal variations as SiO2 thickness increases are observed, exhibiting optimal enhancement with the SiO2 thickness of 250 nm due to the optical interference in the cavity. Although the signal enhancement by optical interference is weaker than that by plasmonic resonance, additional signal amplification is essential for highly sensitive SERS materials. Moreover, we applied this strategy to detect thiram in bean sprout extracts, demonstrating that the detection sensitivity is two orders of magnitude higher than that using Si substrates. The utilization of the pseudo-internal standard intensity calibration method facilitates the quantitative analysis of thiram concentrations. Our results provide a promising approach for further amplification of SERS signals with great potential for practical applications.
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