Abstract
High-performance low-temperature poly-Si thin-film transistors (TFTs) using high-/spl kappa/ (HfO/sub 2/) gate dielectric is demonstrated for the first time. Because of the high gate capacitance density and thin equivalent-oxide thickness contributed by the high-/spl kappa/ gate dielectric, excellent device performance can be achieved including high driving current, low subthreshold swing, low threshold voltage, and high ON/OFF current ratio. It should be noted that the ON-state current of high-/spl kappa/ gate-dielectric TFTs is almost five times higher than that of SiO/sub 2/ gate-dielectric TFTs. Moreover, superior threshold-voltage (V/sub th/) rolloff property is also demonstrated. All of these results suggest that high-/spl kappa/ gate dielectric is a good choice for high-performance TFTs.
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