Abstract
A new high-performance diffracted-beam analyzer consisting of multiple pieces of a perfect crystal is proposed. The pieces of Ge(111) crystal are set so that their crystal lattice planes coincide with tangent planes of a logarithmic spiral function. Each piece of the crystal works in the same manner as a single-crystal analyzer. An X-ray beam diffracted from a specimen is diffracted successively by individual crystals of the analyzer, and these diffracted beams are detected separately by a one-dimensional position-sensitive detector. If the analyzer consists of, for example, ten pieces of crystal, ten diffraction patterns can be observed in a single diffractometer scan, and they can be integrated into a single diffraction pattern. Thus the resulting intensity becomes greater by one order of magnitude, while the angular resolution is the same as that of a single-crystal analyzer. The geometrical aspects of the analyzer are described, and some experimental results are given.
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