Abstract

2D layered materials (2DLMs), together with their heterostructures, have been attracting tremendous research interest in recent years because of their unique physical and electrical properties. A variety of circuit elements have been made using mechanically exfoliated 2DLMs recently, including hard drives, detectors, sensors, and complementary metal oxide semiconductor field‐effect transistors. However, 2DLM‐based amplifier circuit elements are rarely studied. Here, the integration of 2DLMs with 3D bulk materials to fabricate vertical junction transistors with current amplification based on a MoS2/GaTe heterostructure is reported. Vertical junction transistors exhibit the typical current amplification characteristics of conventional bulk bipolar junction transistors while having good current transmission coefficients (α ∼ 0.95) and current gain coefficient (β ∼ 7) at room temperature. The devices provide new attractive prospects in the investigation of 2DLM‐based integrated circuits based on amplifier circuits.

Highlights

  • (emitter–base collector) device, which acts physical and electrical properties

  • Because the thickness of a 2D layered materials (2DLMs) monolayer can be as thin as an atom and the surface is free

  • Zheng Laboratory of Advanced Materials Department of Chemistry of dangling bonds, 2DLMs surpass typical nanostructures that are plagued by dangling bonds and trap states

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Summary

Introduction

(emitter–base collector) device, which acts physical and electrical properties. A variety of circuit elements have been made using mechanically exfoliated 2DLMs recently, including hard drives, detectors, sensors, and complementary metal oxide semiconductor field-effect transistors.

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