Abstract
YBa2Cu3O7−x (YBCO) thick films were grown by hybrid liquid phase epitaxy (HLPE) on (001)SrTiO3 (STO)substrates. In the presence of a 100 nm thick, 5 mol% Au-doped STO buffer, self-field critical current densities,Jcsf, at 77 K of∼2.4 MA cm−2 and criticalcurrents, Icsf, upto 700 A (cm-width)−1 wereachieved. The Jc value is virtually independent of thickness and the growth rates are very high(∼1 µm min−1). From transmission electron microscopy (TEM),Y2O3 nanocloudextended defects (∼100 nm in size) were identified as the pinning defects in the films. Enhanced random pinningwas induced by the presence of Au in the buffer.
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