Abstract
Abstract. An existing analytical transmission line model to describe propagation properties of coplanar waveguides including dispersion and radiation effects was extended to take into account surface roughness of conductor traces. The influence of parasitics is successively included in the simulation and compared to measurements. The device under test (DUT) was fabricated on an Al2O3 wafer. A metal and ceramic chuck was utilized during measurements up to 120 GHz. The extended model is then capable of precisely predicting propagation properties in a wide frequency range and can now be used for calibration purposes like the development of uncertainty budgets.
Highlights
Coplanar waveguides (CPWs) are frequently used in all different kinds of planar circuits like PCBs and on-wafer applications
An existing analytical transmission line model to describe propagation properties of coplanar waveguides including dispersion and radiation effects was extended to take into account surface roughness of conductor traces
Analytical transmission line models are required for developing reliable uncertainty budgets for calibration purposes (Arz et al, 2017) and have fundamental importance to microwave design
Summary
Coplanar waveguides (CPWs) are frequently used in all different kinds of planar circuits like (printed circuit boards) PCBs and on-wafer applications. Such an analytical model was presented in the early nineties (Heinrich, 1993) This quasi-TEM approach describes the electrical behavior of a CPW from DC to a certain frequency – depending on CPW dimensions – from where on radiation and additional dispersion, due to coupling to higher order modes, take place. This paper shows the application of a roughness model (Gold and Helmreich, 2012) that is capable of accounting for impact on loss and delay of transmission lines to the contemplated CPW model This new extension allows for precisely describing properties of CPWs including all known parasitic effects. The model predictions are compared to measurements of CPWs on Al2O3 with both metal and ceramic chuck and show a very good agreement in both scenarios
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