High frequency high voltage probe embedded into an extremely low inductivity high voltage supply connection

Abstract

For some high voltage devices the frequency response is of interest. Besides the generation of high voltage high frequency signals, the transmission and measurement of the signal is a challenge. Due to the great physical dimensions of high voltage assemblies, the inductance of these is very high, which limits the frequencies that can be used to test. It is critical to know the input signal. The more information about the input signal is known, the better the response can be calculated. The impact of high voltage dividers cannot be neglected at higher frequencies (kHz and up). Therefore a different reference is of need. To solve these problems, a high voltage connector with extremely low inductance and an integrated voltage probe has been developed. By reducing the inductivity of the connection, the frequency range of the test signal can be increased. The integrated voltage probe makes it possible to precisely measure the input signal, serving as reference. Therefore it is possible to precisely calculate the frequency response of the DUT, possibly leading to better diagnostics.