Abstract
A uniform high-frequency solution is presented for the field radiated at finite distance by a semi-infinite beam-scanning array of magnetic line sources located on a perfectly conducting half-plane. The field is represented in terms of Floquet waves plus their relevant singly and doubly diffracted rays, which arise from both the end of the array and the edge of the half-plane. This representation is uniformly valid also when transition conditions from propagating to evanescent Floquet waves occur. Furthermore, it provides a simple and attractive physical interpretation and is found numerically very effective, due to the fast convergence of the Floquet wave expansion for the field.
Highlights
AUNIFORM high-frequency solution for a semi-infinite array of impressed magnetic line sources located on a perfectly electric conducting (PEC) half plane is presented in this paper
A further change of the scan conditions causes a transition from PFW to evanescent FW (EFW); this corresponds to a Floquet wave (FW) pole that moves around the knee at of the contour depicted in Fig. 2(b) and turns from real to imaginary
A uniform high-frequency solution is presented for a semiinfinite beam-scanning array of magnetic line sources located on a perfectly conducting half-plane
Summary
AUNIFORM high-frequency solution for a semi-infinite array of impressed magnetic line sources located on a perfectly electric conducting (PEC) half plane is presented in this paper. As depicted, the high-frequency description of the total radiation mechanism is given in terms of FW’s, singly diffracted rays excited at the edge of the array by the incident FW’s, and doubly diffracted rays excited at the edge of the half-plane by the singly diffracted grazing ray These latter ray contributions provide an estimate of the field in the optical shadow region and ensure the continuity of the total field at those grazing aspects, where the singly diffracted field exhibits a discontinuity. These latter are expressed in terms of the multiple-argument transition function derived in [6] and [7] for the double diffraction at a couple of wedges and used in [8] for describing the diffraction at a vertex of a plane angular sector.
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