Abstract

Heavily boron-doped polycrystalline silicon has been reported to be characterized by somewhat unexpectedly high power factor. High Seebeck coefficients are however unexpected in materials with high carrier densities. A semiquantitative model was proposed, showing that the potential barrier structure at grain boundaries, along with the nanometric grain size, leads to an unusual mechanism of carrier filtering, named adiabatic energy filtering. Actually, the presence of potential barriers associated with segregated boron disables charge transport by holes in the band deep tail. This leads to a decrease of the actual carrier density, as in the case of standard energy filtering. However, the nanometric grain size along with the inefficiency of the hole-hole relaxation mechanism in degenerate semiconductors actually prevents carriers from relaxing, causing an increase of the average (macroscopic) drift mobility. Thus, in spite of the decrease of drifting hole density the electrical conductivity is found to increase. In this communication a refinement of the model is presented, that will be discussed and corroborated with an extended body of experimental data gathered by several authors on degenerate polycrystalline silicon films.

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