Abstract
AbstractA new spectrometer based on a plane crystal wavelength dispersive method using a position‐sensitive proportional counter (PSPC) in conjunction with an x‐ray microbeam formed by a monolithic polycapillary x‐ray focusing lens has been developed. The new spectrometer could be used for x‐ray microfluorescence (XRMF) analysis with high sensitivity, high spatial resolution and energy resolution simultaneously. The minimum spot size of the x‐ray beam focused by the lens is 50 µm for Cu Kα. An energy resolution of 4.4 eV is obtained for Ti Kα by means of the spectrometer. The detectable energy range of the spectrometer in one run without a scanning procedure is more than 800 eV. Some results of sample analysis with the spectrometer are presented. Copyright © 2004 John Wiley & Sons, Ltd.
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