Abstract
In a conventional scattering-type scanning near-field optical microscopy setup, the atomic force microscope probe is unable to effectively couple with s-polarized light, resulting in low signal and limited in-plane sensitivity. This study aims to investigate a high-resolution probe with enhanced responsivity to both s- and p-polarized light. Full-wave electromagnetic method of moments simulations are utilized. Simulated near-field spectra on prototypical materials (SiO2, Si, SrTiO3), as well as simulated raster scans of a gap nanoantenna, indicate a two order of magnitude increase of the scattering signal for s-polarized incident and detection scheme compared to the conventional probe.
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