High efficiency and stability gratings recorded in GeAsS thin films

Abstract

Scalar and vector gratings were recorded and studied on amorphous chalcogenide Ge25As30S45 thin films motivated by the promise of their high stability and photosensitivity. Films were prepared by e-beam evaporation technique. The holographic gratings were recorded by using light of 514.5 nm wavelength (near the material band gap). Those gratings have shown significantly better thermal resistance compared to those recorded on As2S3 thin films fabricated by the same method. Very preliminary analyses of possible photo sensitivity mechanisms involved is presented.