Abstract
Scalar and vector gratings were recorded and studied on amorphous chalcogenide Ge25As30S45 thin films motivated by the promise of their high stability and photosensitivity. Films were prepared by e-beam evaporation technique. The holographic gratings were recorded by using light of 514.5 nm wavelength (near the material band gap). Those gratings have shown significantly better thermal resistance compared to those recorded on As2S3 thin films fabricated by the same method. Very preliminary analyses of possible photo sensitivity mechanisms involved is presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
