High-bandwidth CMOS test buffer with very small input capacitance

Abstract

An analogue CMOS buffer configuration, which eliminates the tradeoff between high bandwidth and very low input capacitance, has been designed and simulated in a standard 2 μm process. The circuit shows a total input capacitance less than 50 fF up to 12 MHz and less than 110 fF overall with a 3 dB bandwidth of 20 MHz when driving a 15 pF and 100 kω load. The very small input capacitance and high bandwidth make the circuit very suitable for testing internal sensitive nodes in CMOS analog or mixed-mode circuits.