Abstract

Fabrication of high aspect ratio patterns with an aspect ratio larger than 10 is attempted by nano imprint lithography. A fine mold using a chemical vapor deposition (CVD) diamond layer is newly developed by electron cyclotron resonance (ECR) using Cl2-O2 gas. Narrow grooves less than 100 nm in width and 1.0 µm in depth are successfully obtained. Using medium molecular weight PMMA (Mw=350 k) and with slow advance of the cooling sequence in the imprint process, the fatal error of the polymer fracture is eliminated at the mold release process. Based on the advanced process, we first demonstrate the fabrication of high aspect ratio patterns over 20 with 80 nm line width, however, the polymer might be stretched during the mold release process.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.