Abstract
Using high-angle annular dark-field scanning transmission electron microscopy, we investigated electron-beam-induced fragmentation (EBIF) processes in NiBi alloys. We are able to establish the presence of very small clusters of nanoparticles that eluded detection in earlier TEM work and, furthermore, confirm the existence of core-shell particles with a Bi core and a Ni-Bi shell. On the basis of these and earlier observations, we propose a general mechanism for the creation of core-shell particles using EBIF.
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