Abstract
[100]-tilt grain boundary Josephson junctions have been fabricated using epitaxial (Hg0.9Re0.1)Ba2CaCu2Oy ((Hg,Re)-1212) films grown on SrTiO3 bicrystal substrates with thin buffer layers of 123 compounds. The junctions with the tilt angles of 30° and 36.8° exhibited resistively-shunted-junction-type current-voltage characteristics with very low excess current in a wide temperature range from 4.2 to 110 K. They also showed the characteristic voltages or the products of the critical current Ic and the normal resistance Rn of 1.0–1.4 mV and 0.2–0.4 mV at 77 K and 100 K, respectively, which are substantially higher than those for (Hg,Re)-1212 [001]-tilt junctions. Strong hysteresis in the magnetic field dependence of Ic curve was observed for the applied field larger than a certain threshold value, suggesting flux penetration between the CuO2 planes.
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