Abstract
The microscopic interaction of Hg1−xCdxTe surfaces with refractory metals was examined through synchrotron radiation photoemission studies of HgCdTe cleaved in vacuum and of HgCdTe-Cr junctions formed in situ. The results indicate that strong Te-Cr interdiffusion is accompanied by rapid Hg depletion of the surface layer. In sharp contrast to similar studies of simple and noble metals on HgCdTe, variations in the surface anion-to-cation ratio and the Hg-to-Cd ratio do not affect the interface position of the Fermi level. The strongly inverted character of the near-surface region found after cleaving appears to be preserved during the Hg-Cr exchange reaction.
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