Hg1-xCdxTe characterization measurements: current practice and future needs

Abstract

An extensive industrial survey of the importance and use of characterization measurements for HgCdTe materials, processes and devices has been completed. Seventy-two characterization/measurement techniques were considered and thirty-five responses were received. This information was sought for a study on materials characterization and measurement techniques of parameters and properties necessary to improve the manufacturing capabilities of HgCdTe infrared detectors. The nature of materials characterization is defined, and an overview is given of how it is related to improving IR detector manufacturing. Finally, the authors present a description of the characterization survey and a summary of the survey results. Major aspects of the results include: (1) ranking the 72 techniques by their importance and frequency of use, (2) listing the parameters or properties determined by each technique, (3) enumerating the most important properties that need to be measured, (4) indicating the key measurement techniques that most need to be developed, enhanced or improved, and (5) giving key overall comments.