Abstract
AbstractWe have measured the electrical, optical and morphological properties of as-grown Hg1-xCdxTe films prepared by r.f. sputtering. The Hg1-xCdxTe films were grown at substrate temperatures ranging from 25°C to 150°C. Films grown at temperatures lower than or equal to 70°C were highly resistive (≥105 Φ-cm) and were not measurable by our Hall apparatus. Optical transmission data show that the band gap of these films ranged from 0.8 eV-1.5 eV, satisfying the optimum band gap criteria. Plan view and cross sectional SEM studies indicate that the films grown at 85°C and 100°C have larger grains with compact grain boundaries and these films typically yield the best cell performance. Spectroscopic ellipsometry studies are being used to estimate the band-gap as a function of substrate temperature.We have also studied the effect of various back contacts and have fabricated complete solar cells. We found that Cu-Au serves as the best ohmic back contact to CdS/HgCdTe solar cell. Our preliminary results of J-V analyses on the complete solar cell show that the efficiency is mainly limited by the short-circuit current. Electrical-bias-dependent QE measurements indicate voltage-dependent current collection mainly in the long wavelength region. Further optimization of growth parameters and CdCl2 treatment needs to be carried out to improve the cell performance.
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